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At “Nanomechanical Testing in Materials Research and Development X” in Rhodes, Prof. Dr. Johann Michler (Empa, EPFL) presented “High-throughput analysis of material libraries”, showing how Swissmapper measures chemical composition, microstructure, and mechanical, optical, and electrical properties in a single benchtop instrument.
Yannick Künzli and Damian Rhyn from the University of Bern’s Pattern Recognition Group (Prof. Kaspar Riesen) start joint Master’s theses with Empa’s Laboratory for Mechanics of Materials and Nanostructures. Their projects develop machine learning methods for Swissmapper, so that the large datasets from high-throughput experiments can be analyzed automatically.
A team from the Natural History Museum of Bern visited Empa to map geological samples with Swissmapper. It is always exciting to see high-resolution multimodal mapping open up new applications beyond thin films.
Iuliia Baranova has successfully defended her Master’s thesis in Precision Engineering, “Phase Selection in Cu-Based Ternary Alloys: From Prediction to High-Throughput Thin Film Experiments”. The joint project of the University of Bern and Empa used Swissmapper for high-throughput characterization.
At “KI für die Materialentwicklung” in Brugg, hosted by Hightech Zentrum Aargau and nano.swiss, Prof. Dr. Johann Michler (Empa, EPFL) presented Swissmapper as a new tool for AI-assisted high-throughput synthesis and analysis of thin films.
At the European Powder Diffraction Conference in Crans-Montana, Dr. Remo Widmer presented “High-Throughput μXRD² Mapping and Analysis of Combinatorial Thin Films”, an in-depth look at how X-ray diffraction and X-ray fluorescence complement each other in high-throughput mapping.
Empa’s article on the Hightech Zentrum Aargau website presents the first Swissmapper prototype: a fully automated platform that combines five characterization techniques for thin-film samples up to 4-inch wafers.
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